X-ray spectrometer Epsilon 1

X-ray fluorescencefor elemental analysisinspection

Do you need elemental analysis of small objects or small inclusions in electronic appliances, toys, jewelry, rocks or finished products? Epsilon 1 for small spot analysis, a compact X-ray fluorescence spectrometer with an analyzing spot size of 0.8 x 1.2 mm, is the ideal analytical solution for a flexible and precise spot-on analysis. Due to the self-contained design and small footprint, Epsilon 1 can be placed close to the sample location, making the instrument an ideal solution for any elemental analysis in production facilities, exploration sites, at the shop counter or even at crime sites for forensic investigation. The performance of the spectrometer meets the standard test methods required by different directives and regulations in various industry markets, like RoHS-3 for electronics and CPSIA for many consumer goods. Robust and flexible quantification Spot-on results are provided for a wide range of applications, like RoHS-3, WEEE, ELV, toys, jewelry, rocks and final product inspection. This is made possible by Omnian, PANalytical’s market-leading standardless analysis software package, also used on the more advanced XRF instruments. As an out-of-the-box solution, Omnian can be used to analyze a wide variety of elemental compositions from sodium to americium across the periodic table. With dedicated calibrations, it is possible to follow international test methods, like ASTM F2617 (RoHS), or to screen according to the specifications described by ASTM F963 (toys) and IEC 62123 (electronics).