Optical microscope MC seres
inspectionmeasuringmetallurgical

Optical microscope - MC seres - MEIJI TECHNO - inspection / measuring / metallurgical
Optical microscope - MC seres - MEIJI TECHNO - inspection / measuring / metallurgical
Optical microscope - MC seres - MEIJI TECHNO - inspection / measuring / metallurgical - image - 2
Optical microscope - MC seres - MEIJI TECHNO - inspection / measuring / metallurgical - image - 3
Optical microscope - MC seres - MEIJI TECHNO - inspection / measuring / metallurgical - image - 4
Optical microscope - MC seres - MEIJI TECHNO - inspection / measuring / metallurgical - image - 5
Optical microscope - MC seres - MEIJI TECHNO - inspection / measuring / metallurgical - image - 6
Add to favorites
Compare this product
 

Characteristics

Type
optical
Technical applications
inspection, measuring, metallurgical
Microscope head
binocular, trinocular
Observation technique
polarized

Description

Meiji Techno's MC Series Precision Measuring Systems are composed of high quality metallurgical microscope components, precision X stages and durable heavy duty stands. Meiji Techno measuring microscopes are available with 1-axis electronic digital readouts in inches and metric. These systems can be configured for use with 35mm photomicrography, analog CCD video, digital CCD video, digital CMOS video and consumer-grade digital still camera systems. Operators can perform visual inspection and measurement of small items or components without complicated system setup. Mitutoyo Digimatic Micrometer heads have serial output for SPC applications. MC Series Systems are available in 110 or 220 volt configurations. MC-45 & MC-55 SERIES BRIGHTFIELD AND SIMPLE POLARIZATION OBSERVATION METALLURGICAL MEASURING/TOOL MAKERS COMPOUND MICROSCOPES INFINITY CORRECTED OPTICAL SYSTEM F=200MM Z AXIS MEASURING MICROSCOPES QUADRUPLE NOSEPIECE Brightfield: The simplest of all the metallurgical optical microscopy illumination techniques. Sample illumination is incident (i.e., illuminated from above and observed from above) white light and contrast in the sample is caused by absorbance of some of the incident light in dense areas of the sample. Brightfield microscopy is the simplest of a range of techniques used for illumination of samples in light microscopes and its simplicity makes it a popular technique. The typical appearance of a brightfield microscopy image is dependent on the type of illumination technique used. Simple Polarizing Light: Transverse wave light whose vibration possess direction is called polarized light.

Catalogs

No catalogs are available for this product.

See all of MEIJI TECHNO‘s catalogs
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.