Magnetic probe station MPS-C series

The MPS-C-300 and MPS-C-350 magnetic probe systems are the world’s first probe stations capable of providing three-dimensional magnetic field control around a device under test. MicroXact’s truly unique patent-pending design enables wafer-level testing of spintronic devices, nanoscale electronics and many other materials and devices where magnetic fields are required for accurate test and measurement. Spin-current and spin torque oscillator testing, magnetic simulation and identification of anisotropy of complex multilayer structures are just few examples applications of our MPS systems. Features • MPS series magnetic probe stations are the only probe stations on the market that offer arbitrary two- or three-dimensional orientation of applied magnetic field, making these probe stations an ultimate solution for spintronic device characterization and spintronic research. • MPS series magnetic probe stations are the only probe stations on the market that offer wafer-scale Vector magnetic field probing, making these systems ideally suited for testing of spintronic and magneto-electronic devices in production environments. • Fully customizable, open-source LabView-based control software that easily integrates with the most common test and measurement devices. • Available high-resolution micropositioners with 40, 80, 100 and 200TPI screws for down to micron-level positioning of probes. • Data collected and/or analyzed with a wide range of output formats and options available. • Systems are supplied with a three-dimensional Hall probe to provide unmatched stability and accuracy of the applied magnetic field via closed-loop control.