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Infrared video microscope VMU series
inspectionbright fielddark field

Infrared video microscope - VMU series  - MITUTOYO - inspection / bright field / dark field
Infrared video microscope - VMU series  - MITUTOYO - inspection / bright field / dark field
Infrared video microscope - VMU series  - MITUTOYO - inspection / bright field / dark field - image - 2
Infrared video microscope - VMU series  - MITUTOYO - inspection / bright field / dark field - image - 3
Infrared video microscope - VMU series  - MITUTOYO - inspection / bright field / dark field - image - 4
Infrared video microscope - VMU series  - MITUTOYO - inspection / bright field / dark field - image - 5
Infrared video microscope - VMU series  - MITUTOYO - inspection / bright field / dark field - image - 6
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Characteristics

Type
infrared
Technical applications
inspection
Observation technique
bright field, dark field
Configuration
compact
Weight

650 g, 750 g, 1,270 g, 1,300 g, 1,400 g
(22.9 oz, 26.5 oz, 44.8 oz, 45.9 oz, 49.4 oz)

Description

Microscope lineups thaï systems observation, measurement and processing •Compact and lightweight microscope unit dedicated observation by camera. Suitable for inspecting metal surfaces, semiconductors, liquid crystal substrates, resm, etc. •A versatile microscope head typically used as an OEM product suitable for fitting to specialist machines, such as those designed for inspection and repair of semiconductor wafers using YAG (neannfrared, visible, nearultraviolet. or ultraviolet) laser* • The performance and safety of the laser-equipped system products 6 not guaranteed App*catcns cutting, tnmmng. correcting. marVrg of semiconductor orcuits / deanng & processing of thin Hms {insulation films), repairing (correcting failure) of liqud crystal cofcr filters Also suited for use as the optical observation sector for a prober analyzing semiconductor failures. •For VMU-LB and VMU-IB. the rigidity and general performance of the microscope mam unit have been enhanced compared with previous models •Applications* internal observation of silicon systems, spectral characteristics analysis using infrared, etc. •An nfrared seme and nfrared camera are necessary •Telecentric system equipped with an aperture diaphragm is standard on the surface illumination optical system Best suited to process images for which the uniform illumination is required Available for the dimensional measurement, form inspection, positioning, etc. •Design and manufacture are available to meet your demands such as double camera mounting, double (low/tngh) magnification.

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Exhibitions

Meet this supplier at the following exhibition(s):

Hyvolution 2025
Hyvolution 2025

28-30 Jan 2025 paris (France) Stand 6B40

*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.