AFM microscope Alphacen 300
industrialautomated

AFM microscope
AFM microscope
AFM microscope
AFM microscope
AFM microscope
AFM microscope
AFM microscope
Add to favorites
Compare this product
 

Characteristics

Type
AFM
Technical applications
industrial
Other characteristics
automated

Description

The Alphacen 300 system is a unique AFM solution that can handle large and heavy samples with ease. It features the Flex-Mount scan head, which has a tip-scanner design that enables high-performance imaging regardless of the sample size or weight. The CX controller, Nanosurf's most advanced AFM controller, offers fast and precise control over the scan process. The dedicated acoustic enclosure reduces external noise and vibrations. Moreover, the system can be further customized with additional translation or rotation axes to suit your specific sample. No other AFM system offers such versatility and functionality. • Tip scanner design ensures high-quality imaging regardless of sample size or weight • Samples up to 300 mm x 300 mm and 45 kg • A dedicated acoustic enclosure to minimize external noise and vibrations • Can serve as basis for custom solutions Research-Grade Tip-Scanning Design Using the proven research scan head technology from Nanosurf’s FlexAFM, the Alphacen 300 delivers high-quality imaging and reliable performance. The scanner features a flexure-based tip design that ensures flat and linear scanning, high resolution, and stable operation. Large and Heavy Samples The Alphacen 300 is a tip-scanning AFM that can handle large and heavy samples with ease. You can measure samples up to 300 mm x 300 mm in size and up to 45 kg in weight with this device. The 50 mm z approach stage also enables you to mount thick samples without any hassle.

VIDEO

*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.