AFM microscope Flex-Mount

industrialhigh-resolutionautomated

Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM. The result is a tip-scanning AFM that can easily be attached to one of Nanosurf’s large, custom-built motorized translation stages and is thus able to characterize the surface of samples with weights and dimensions virtually no other AFM system can handle. • Proven performance and reliability in industrial settings • Tip scanning design for maximal flexibility • Automation capabilities • Purpose-built for integration • Measure samples of any weight and dimensions Research-Grade Scan Head for Integration Flex-Mount is based on the FlexAFM, Nanosurf’s most widely used research scan head. The flexure-based tip scanner provides flat and linear scanning, high resolution, and stable operation. Unlimited Freedom with Custom Stages Get the ideal automated AFM solution designed for your application, or integrate the Flex-Mount with your existing stage system. Nanosurf is the leading provider of integration solutions and custom developments for industrial customers with highly specific requirements. Large, Non-Planar, and Curved Samples Flex-Mount, in combination with the right stage, will provide you with precise measurements on samples of any size. Tilting of the scan head, coupled with freedom of movement in any axes you require, will allow you to reach any sample area of interest easily also on curved samples.