Heat flow for thermal conductivity testing measuring instrument NanoTR

reflection testlaserflash lamp-based

Time Domain Thermoreflectance Methods - The Laser Flash method for thin films Laser Flash Method The Most Established Method for the Determination of Thermal Diffusivity In modern industries, the knowledge of thermal propeties, specifically thermophysical properties, becomes more and more important. They are required, for example, for the development of heat release materials of advanced and miniaturized electronics, thermoelectric materials as sustainable energy, insulating materials for saving energy, TBCs (thermal barrier coatings) for turbine blades, and safety operation of nuclear plants, etc. Among the thermophysical properties, the thermal conductivity is of paramount importance. The determination of the thermal diffusivity/thermal conductivity can be realized with the established laser flash method (LFA). This method has been known for many years to provide reliable and accurate results. Sample thicknesses typically range from 50 um to 10 mm. NETZSCH is a world-wide leading manufacturer of instruments for testing thermophysical properties, specifically of laser flash analyzers. These LFA systems are used in the fields of ceramics, metals, polymers, nuclear research, etc. Time Domain Thermoreflectance Methods The Method for the Determination of Thermal Diffusivity in the Thickness Range of Nanometer With the significant progress in the design of electronic devices and the associated need for an efficient thermal management, accurate thermal diffusivity / thermal conductivity measurements in the nanometer range are more than ever crucial.