Optical microscope Eclipse Ci-POL
for materials inspectionfor surface inspectionfor analysis

Optical microscope - Eclipse Ci-POL - Nikon Metrology - for materials inspection / for surface inspection / for analysis
Optical microscope - Eclipse Ci-POL - Nikon Metrology - for materials inspection / for surface inspection / for analysis
Optical microscope - Eclipse Ci-POL - Nikon Metrology - for materials inspection / for surface inspection / for analysis - image - 2
Optical microscope - Eclipse Ci-POL - Nikon Metrology - for materials inspection / for surface inspection / for analysis - image - 3
Optical microscope - Eclipse Ci-POL - Nikon Metrology - for materials inspection / for surface inspection / for analysis - image - 4
Optical microscope - Eclipse Ci-POL - Nikon Metrology - for materials inspection / for surface inspection / for analysis - image - 5
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Characteristics

Type
optical
Technical applications
for materials inspection, for surface inspection, for analysis, for research, gemological, for non-metallic inclusion inspection, for thin-film measurements, educational, industrial, multipurpose, for quality control, for materials research, for forensics
Ergonomics
upright
Microscope head
trinocular, binocular
Observation technique
bright field, fluorescence, polarization, spectral, dark field, differential interference contrast
Configuration
benchtop, compact, portable
Light source
with coaxial illumination
Other characteristics
modular, digital camera, high-resolution, ergonomic, asbestos identification, high-magnification, long working distance, image-processing, cost-effective, simple installation, high-contrast, with light intensity manager, variable temperature, high-precision, for flat samples, image capture
Magnification

Min.: 5 unit

Max.: 100 unit

Weight

14 kg
(30.9 lb)

Length

271 mm
(10.7 in)

Width

247 mm
(9.7 in)

Height

450 mm
(17.7 in)

Description

The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative and qualitative study. All Applications from Research to Routine are Addressed Superb Nikon CFI60-POL optics provide excellent images to eyepieces and to Nikon’s digital cameras. LV100N POL enables a range of studies from conoscopy to orthoscopy using a full range of dedicated accessories. Ci-POL enables a range of studies on a compact microscope. Nikon ECLIPSE LV100N POL and Ci-POL These instruments feature episcopic and diascopic illumination for mineralogical study of gross or thin sections. Optically active materials may be studied for composition and distribution analysis. Nikon CFI60-POL Objective Lens Series Nikon’s innovative, strain free, long working distance, high NA, eco-glass component POL objectives deliver clear, high contrast images to the observer and digital camera. Diascopic and Episcopic Illumination Episcopic studies are possible with the LV-UEPI-N illuminator. The 12V-50W lamphouse is used for diascopic and episcopic illumination. Switching illumination, epi to dia, is a simple operation. Full Range of Optical Accessories A comprehensive range of accessories for quantitative analysis is provided by Berek, Senarmont and Quartz wedge compensators, supported by a vernier scale mechanical stage. 30mm Long Focus Stroke LV100N POL and Ci-POL stands accept tall, gross samples due to the extra-long 30mm focus range, exceeding the normal range of diascopic microscope models.

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