Optical microscope Eclipse LV150N
inspectionindustrialupright

Optical microscope - Eclipse LV150N - Nikon Metrology - inspection / industrial / upright
Optical microscope - Eclipse LV150N - Nikon Metrology - inspection / industrial / upright
Optical microscope - Eclipse LV150N - Nikon Metrology - inspection / industrial / upright - image - 2
Optical microscope - Eclipse LV150N - Nikon Metrology - inspection / industrial / upright - image - 3
Optical microscope - Eclipse LV150N - Nikon Metrology - inspection / industrial / upright - image - 4
Optical microscope - Eclipse LV150N - Nikon Metrology - inspection / industrial / upright - image - 5
Optical microscope - Eclipse LV150N - Nikon Metrology - inspection / industrial / upright - image - 6
Optical microscope - Eclipse LV150N - Nikon Metrology - inspection / industrial / upright - image - 7
Optical microscope - Eclipse LV150N - Nikon Metrology - inspection / industrial / upright - image - 8
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Characteristics

Type
optical
Technical applications
inspection, industrial
Ergonomics
upright
Observation technique
bright field, fluorescence, black field, interference contrast
Configuration
tabletop
Other characteristics
digital camera, modular, for semiconductors
Weight

8.6 kg
(19 lb)

Length

362 mm
(14.3 in)

Width

251 mm
(9.9 in)

Height

519 mm
(20.4 in)

Description

A series of flexible, modular, upright microscopes for various episcopic optical contrast techniques (BF-DF-DIC-POL-Fluorescence-Interferometry). Together with digital imaging accessories and large stage X-Y travels, the instruments are ideal for semiconductor and material inspection activities. Modular, Motorised and Manual Upright Microscopes Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. Thanks to the modular design, the universal microscope allows complementary optical contrast techniques on one microscope stand. Nikon ECLIPSE LV150NA and LV150N These microscopes with episcopic illumination are for inspection of semiconductors, industrial materials and components. They are also suited to research and development applications. Nikon CFI60-2 Optical Series Nikon’s innovative design enables clear imaging techniques, including high-contrast, brightfield, darkfield, polarisation (POL), interference contrast (DIC) and double beam interferometry optical contrast. Nikon Digital Sight Cameras The full range of Nikon’s Digital Sight cameras can capture images of a sample and deliver them to the image processing software of the NIS-Elements suite, together with microscope data on the objective lens, magnification setting and light intensity when using the LV-ECON E controller. Integration of LV150N and Wafer Loader NWL200 Nikon’s wafer loaders are well accepted and trusted across the semiconductor industry and many installations are in use today.

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