Nikon’s versatile, large-envelope X-ray and CT systems can inspect items of diverse size and density, internally and externally, enabling them to perform virtually limitless tasks within industry, inspection bureaux and academia.
A multitude of configuration options to meet your exact inspection requirements
Nikon’s large-envelope system range combines metrology grade, granite-based manipulator construction with a large scanning volume, multi-source flexibility, dual detector functionality and an extensive range of CT acquisition modes, enabling them to excel in any inspection environment, from R&D labs to the shop floor.
Highly Configurable Line-up
With 8 different X-ray sources, 7 detectors, 3 granite base lengths and 2 manipulator constructions to choose from, housed in either a single-piece cabinet, panelised room or pre-existing shielded enclosure, you’ll find a system configuration to match your requirements.
Multi-source Functionality
Select up to 3 X-ray sources from Nikon’s extensive microfocus range to ensure you have the optimum combination of penetrative power, resolution and scan speed for all your applications.
Dual Detector Flexibility
A choice of industry-leading, flat panel detectors with small pixel sizes and fast exposures, combined with Nikon’s unique CLDA, enables high-throughput CT and DR for all part types, plus advanced scatter correction for high-density parts.
Metrology Grade Manipulator
Our granite-based manipulators are combined with rigid towers and precision motors and encoders. The resulting construction ensures superior mechanical and thermal stability, leading to enhanced positional accuracy and repeatability.