Electron microscope ECLIPSE L300N series

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Nikon's ECLIPSE L300ND, L300N and L200ND, L200NA is a range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications. Advanced Semiconductor Microscopes for Inspecting the Latest Fabrications Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and also to Nikon’s digital imaging cameras with analysis software. Combining these superior optics with an extraordinary illumination system delivers images of excellent contrast and resolution. Nikon ECLIPSE L300N(D) and L200N(D) These microscopes are for exceptionally precise optical inspection of wafers (200mm for L200N series and 300mm for L300N series), reticules and other substrates. Nikon CFI60-2 Optical Series Nikon’s innovative design enables clear imaging techniques, including high contrast, brightfield, darkfield, polarisation (POL), differential interference contrast (DIC) and double beam interferometry optical contrast. Nikon Digital Sight Cameras The full range of Nikon’s Digital Sight cameras efficiently captures images of a sample and deliver them to the image processing software of the NIS-Elements suite, together with microscope data on the objective lens used, magnification setting and light intensity. Integration of L200N and Wafer Loader NWL200 Nikon wafer loaders are well accepted and trusted in the semiconductor industry and many installations are in use today.