X-ray inspection machine XT H Series

computed tomographyindustrialfor the electronics industry

Nikon's adaptable microfocus CT systems provide high-resolution inspection of components, ranging from tiny plastic connectors to aluminium castings, for R&D, failure analysis and production quality control. These systems combine the adaptability needed in the lab with unique features like 225 kV Rotating.Target 2.0, Half.Turn CT acquisition mode and Auto.Filament Control to shorten cycle time and improve uptime when used for shop floor series inspection. Flexibility When You Need It With the choice of source, targets, CT scanning strategies and options such as motorised source-to-detector distance adjustment, the XT H systems are versatile and accommodate a wide range of inspection tasks. X.Tend Helical CT Tall objects can be scanned in a single acquisition process, eliminating artifacts introduced by the cone beam and multi-scan stitching. This also provides the added benefit of scanning objects at higher magnification resulting in significantly higher resolution. Unique 225 kV Rotating.Target 2.0 Allows continuous operation up to 450W with up to three times higher resolution for the same power, or three times faster data collection for a given resolution. AI Reconstruction Nikon's AI Reconstruction revolutionises computed tomography (CT) scanning through automated image enhancement powered by artificial intelligence (AI). Tailored to each customer's needs, it provides a new level of speed and quality to unlock superior defect detection while accelerating productivity.