Distance measuring system NEXIV VMZ-K6555 series
thicknessdiametercontour

Distance measuring system - NEXIV VMZ-K6555 series  - Nikon Metrology - thickness / diameter / contour
Distance measuring system - NEXIV VMZ-K6555 series  - Nikon Metrology - thickness / diameter / contour
Distance measuring system - NEXIV VMZ-K6555 series  - Nikon Metrology - thickness / diameter / contour - image - 2
Distance measuring system - NEXIV VMZ-K6555 series  - Nikon Metrology - thickness / diameter / contour - image - 3
Distance measuring system - NEXIV VMZ-K6555 series  - Nikon Metrology - thickness / diameter / contour - image - 4
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Characteristics

Measured physical value
distance, thickness, diameter, contour, position, flatness, shape, angle, level, gap, alignment, roughness, coordinate, orientation, dimensional, geometric
Technology
optical, laser, 3D, video, visual, confocal
Operating mode
automatic, CNC, stand-alone
Measured material
for film, parts, foil, for PCB, strip, tube, for unpatterned wafers, bearing, tool, for profiles, for wafers, solids, integrated circuit, wire, for inside diameter measurements, for lithium ion batteries, for glass
Applications
calibration, for industrial applications, control, laboratory, for electronics, for railway applications, for production lines, for component testing, for the cosmetics industry, for specular surface, for tape production lines, ophthalmic
Configuration
vertical
Other characteristics
high-precision, angular, non-contact, high-speed, non-destructive, profilometer, with wide field-of-view, ultra-high accuracy, high-resolution, rugged

Description

The NEXIV-K Series is capable of high-speed, high-resolution, 3D inspection. Ground-Breaking, Multi-Functional, Confocal Video Measuring System This measuring system incorporates confocal technology, brightfield imaging with a 15X zoom and laser auto focus. No matter what geometrical measurements are needed, whether 2D or 3D, inspection and evaluation is exceptionally fast and accurate. Confocal optics enable a clear display and facilitate accurate detection of high contrast edges. Fine Bump and Substrate Pattern A combination of 2D measurement with a 15x zoom brightfield image and 3D height measurement in the same field of view enables diverse measurements. Probe Cards Programming can be made from location data in one click. XYZ coordinates and coplanarity contact probe pins on probe cards can be automatically measured with unique image processing tools. VMK-K-series-highlight-02 Precise PCB Pattern Nikon’s unique confocal imaging technology makes it possible to accurately scan both highly reflective and low reflectivity surfaces.

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