Optical emission spectrometer VeOS

spark optical emissionlaboratoryfor analysis

Featuring cutting-edge detector technology on the basis of semiconductor detectors that were specially developed for emission spectroscopy, OBLF’s VeOS spark emission spectrometer enables versatile, flexible and quick analysis of all common metallic materials. The analytical spectrum also includes the precise analysis of short wavelength elements like nitrogen or low carbon. BenefitsComplete and flexible inclusion of all analytical tasksEasily extendable featuresThe latest, specially developed detector technologyExcellent performance with regard to detection limit, precision, stabilityRobust design for use in heavy-duty environmentsMost comprehensive multi-matrix application options without any restrictionsregarding the selection of elements for analysisAccurate detection of N and traces of carbon (ULC)OBLF’s VeOS is the first spark spectrometer to feature a semiconductor-based detector system whose analytical performance – including the spectral resolution required for a laboratory spectrometer – is every bit as good as established photomultiplier-based systems. This brand new photo-detector technology was specifically developed for spark emission spectroscopy and guarantees excellent results over the entire required wavelength range of 130 to 800 nm. The design of the light-sensitive detectors, which are characterised by a surface that is 100 times more light sensitive than detectors found in conventional systems, was specially adapted to suit the requirements of emission spectroscopy.