Optical, non contact measurement of warp and bow of specimen with size up to (1600 x 1200) mm
General
The system is designed for the contactless, optical measurement of the curvature (Warp) horizontal, coated float glass substrates. For that measurement the heights on different measuring points is evaluated.
The Warp is calculated as difference between the highest and lowest point.
Hardware
The measuring system has a base plate as contact face for the specimen. The maximum substrate size is 1600 mm x 1200 mm.
The non-flatness of the base plate is 100 micron. The construction of the base plate allows the easy loading and unloading of the specimen. Stop pins serving for the exact end reproducible position of the substrate.
Due to inhomogeneous reflection of the coating, the software is able to process as well high and low reflecting areas on the surface.
The warp measurement runs fully automatic software controlled after starting the measuring procedure. The measuring system can scan the complete substrate area.
The equipment is insensitive against vibration and can be used under production conditions.
The operation of the equipment is controlled by a computer, which belongs to the scope of supply.