Digital I/O card PE32D

32 digital outputs32 digital inputs16 digital inputs

The PE32D represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the PE32, the PE32D offers high performance pin electronics and an enhanced timing generator in a compact, 3U PXI form factor. Each card can function as a 32ch digital subsystem or two 16 ch sites tester. The PE32D also supports deep pattern memory by offering 32 M of onboard vector memory with dynamic per pin direction control and with test rates up to 33 MHz. The PE32T supports -1 ~ +7 VOH VOL VIH VIL per channel and 4 PMU per board. The PE32D offers 16 timing sets, 2 driver TG Edges, 1 strobe TG Edges. 2 Format sets, change on the fly, and four drive data formats are supported: RTZ (Return To Zero), RTO (Return To One), NRZ (Non Return To Zero), SBC (Surround By Complement) which can providing flexibility to create a variety of bus cycles and waveforms to test board and box level products. Two 100MHz 32bit TMU for frequency and time measurement. On-Board Memory The PE32D offers 32 M of vector memory per channel. Programmable pattern cycle times up to 232 or infinite. There are pattern symbols including 0, 1, L, H, X, Z, J, Q. Compatibility All OpenATE Interfaces PXI cards comply with the PXI Specification 2.0 (issued Aug. 2000) Software The PE32D is supplied with API and Pattern Editor. Pattern Editor is a software tool that edits test patterns. Application • Automatic Test Equipment(ATE) • Consumer Digital Functional Test • Digital Pattern Generation • Power Management Device Testing • Hybrid and Digital IC Testing