* 33 MHz Test Rate
* 64 ~ 512 I/O Channels
* 32 M capture & fail log memory
* 32 M vector memory per channel
* PMU (per channel)
* 4 ~ 16 DPS or 64 ~ 128 SMU
* 16 ~ 128TMU
* 16 Timing sets & 2 Format sets change on the fly
* One test program for multi-site
* Max.16 site parallel test
* User friendly Software platform
* Prober interface ready
CIS
MEMS Microphone
Fingerprint Identification
Application
Automatic Test Equipment (ATE)
Functional /DC/OpenShort Test
Digital Pattern Generation /Capture
MEMS / SENSOR Device Testing