Automatic test equipment VATE
digitalDC

Automatic test equipment - VATE - OpenATE Inc. - digital / DC
Automatic test equipment - VATE - OpenATE Inc. - digital / DC
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Characteristics

Operating mode
automatic
Technology
digital
Other characteristics
DC

Description

* 33 MHz Test Rate * 64 ~ 512 I/O Channels * 32 M capture & fail log memory * 32 M vector memory per channel * PMU (per channel) * 4 ~ 16 DPS or 64 ~ 128 SMU * 16 ~ 128TMU * 16 Timing sets & 2 Format sets change on the fly * One test program for multi-site * Max.16 site parallel test * User friendly Software platform * Prober interface ready CIS MEMS Microphone Fingerprint Identification Application Automatic Test Equipment (ATE) Functional /DC/OpenShort Test Digital Pattern Generation /Capture MEMS / SENSOR Device Testing

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.