Microscope calibration equipment 043-102302-72
for environmental analysisfor residual dirt analysislaboratory

Microscope calibration equipment - 043-102302-72 - OPTO - for environmental analysis / for residual dirt analysis / laboratory
Microscope calibration equipment - 043-102302-72 - OPTO - for environmental analysis / for residual dirt analysis / laboratory
Microscope calibration equipment - 043-102302-72 - OPTO - for environmental analysis / for residual dirt analysis / laboratory - image - 2
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Characteristics

Applications
for microscopes, for environmental analysis, for residual dirt analysis
Options
laboratory

Description

Opto's Particle Test Target allows the calibration of measurement functions in microscopes through objects in different forms and sizes or of resolution of an optical system measured in Line Pairs per mm. It is used in the field of Residual Dirt Analysis. The Particle Standard Target allows the calibration of measurement functions in microscopes, to analyze and measure particles. A field of objects in different forms and sizes allow the user to check: rectangles, ellipsis, circles, rings and even fibre-shaped objects. To determine optical distortions there are three different sized arrays of cross-targets. The smallest Object is as small as 5μm. For the calibration of the resolution (magnification) two scale bars in X and Y are applied in a corner of the target. Opto's Particle Test Target contains defined particles in different shapes and sizes for easy system calibration of 1. Scale and angular alignment 2. Size classes according to VDA 3. Distortion fields 4. Distortion field 5. Area of particles (simulating residual dirt filter sample) Optional with DVD Certificate • Calibration objects • Calibration method • Measuring condition • Environmental conditions • Measurement uncertainty • Measurement results

Exhibitions

Meet this supplier at the following exhibition(s):

Cell Bio24

14-18 Dec 2024 San Diego (USA - California) Stand TBD

  • More information
    SPIE Photonics West 2025
    SPIE Photonics West 2025

    25-30 Jan 2025 San Francisco (USA - California)

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    *Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.