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Power amplifier E-536 series
for piezo-electric actuatorspiezolow-noise

Power amplifier - E-536 series - PI Ceramic GmbH - for piezo-electric actuators / piezo / low-noise
Power amplifier - E-536 series - PI Ceramic GmbH - for piezo-electric actuators / piezo / low-noise
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Characteristics

Type
power
Other characteristics
low-noise, piezo, for piezo-electric actuators
Voltage

Min.: -250 V

Max.: 250 V

Current

Min.: 15 mA

Max.: 200 mA

Power

Min.: 6 W

Max.: 100 W

Frequency

Min.: 125 Hz

Max.: 10,000 Hz

Description

High Dynamics and Resolution in up to Three Axes • For P-363 PicoCube systems • Extremely low noise • Variants: High dynamics & high resolution PicoCube controller in two variants The E-536 PicoCube controller has three extremely low-noise amplifier channels for high-volt shear actuators. The controller was specially designed to meet the requirements of extremely fast and high-resolution PicoCube XY(Z piezo scanners. The E-536 is offered in two variants for voltage ranges of -250V to +250 V and allows both static and dynamic applications. The performance-optimized E-536.3x for especially dynamic applications is able to output peak currents of 200 mA within a small signal bandwidth of 10 kHz. The E-536.3xH model variants with optimized resolution achieve a position resolution with the PicoCube lower than 0.03 nm at a peak power up to 50 W. Both variants are available for closed-loop and open-loop operation. Higher precision due to capacitive sensors The E-536.3C versions have an integrated sensor / servo controller for closed-loop operation. The position is controlled, for example by the PicoCube nanopositioning system with capacitive sensors, which then achieve a resolution to 0.1 nm. Fields of application • Scanning probe microscopy • Atomic force microscopy • Scanning and screening Highest resolution with high dynamics Open-loop operation is ideal for applications where fast response times and very high resolutions are essential. The specification for position feedback in absolute values is either not significant or is done by external sensors, as is the case in atomic force microscopy.

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