PST6747A semiconductor testing system is the professional instrument for measuring and analyzing the static parameters of power semiconductor devices, which can provide a complete test solution for different kinds of power semiconductor devices.
It is a favorable IGBT Static parameter test platform.
PST6747A can measure and analyze the static parameters of power semiconductor devices accurately under 3KV (10kV, optional) and 2200A. PST6747A has the ability of fast pulse, fA level current detection capability, and has superior wide voltage and current measurement ability. These functions can be used to test the latest type device, such as IGBT, and new materials, such as GaN and SiC.
PST6747A is composed of independent high-precision sources, including P6701B (3kV high-voltage high-precision source), P6703B (high-precision source) and P6705A (2200A high-current source), etc. There are two separated AD(Analog-Digital) converters which supports 2µS sampling rate provided on each power source module. The drive on each module can be controlled independently and accurately, and the key timing which may affect the characteristics of the semiconductor can be monitored accurately.
For testing different kinds of power semiconductor and power circuits, the instrument is more convenient to use and has better data analysis ability. At the same time, the software developed by PONOVO also simplifies the management of measurement data. The software can be customized according to the needs of users, so that users have a better user-friendly experience.