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Analysis microscope SAM 300 E
scanning acoustic

Analysis microscope - SAM 300 E - PVA TePla Analytical Systems GmbH - scanning acoustic
Analysis microscope - SAM 300 E - PVA TePla Analytical Systems GmbH - scanning acoustic
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Characteristics

Technical applications
for analysis
Other characteristics
scanning acoustic

Description

The SAM Line offers easy-to-use scanning acoustic microscopes for process control and quality assurance as well as for research applications. The individual models are derived from a component platform that complies with industry standards and incorporates cutting-edge production and manufacturing technologies. Thanks to their new high-frequency and transducer technology, our acoustic microscopes enable detailed acoustic analysis in the ultrasound range up to 400 MHz. - Linear-powered, low-noise scanner - Not suitable for 24/7 operation - Analysis of samples in the ultrasound frequency range up to 400 MHz - Particularly suitable for detailed acoustic measurement - Equipped with a graphical user interface for ease of operation and flexible applicability - Scanning range: x = 320 mm; y = 320 mm - 1 giga-sample ADC
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.