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Scanning acoustic microscope SAM 300
for analysisfor researchindustrial

Scanning acoustic microscope - SAM 300 - PVA TePla Analytical Systems GmbH - for analysis / for research / industrial
Scanning acoustic microscope - SAM 300 - PVA TePla Analytical Systems GmbH - for analysis / for research / industrial
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Characteristics

Technical applications
for analysis, for research, industrial
Other characteristics
scanning acoustic

Description

The SAM 300 scanning acoustic microscopes are dedicated to high throughput, non-destructive analysis for quality control and research applications. These systems enable detailed acoustic investigations through new rf and transducer technologies of up to 400 MHz. Built to industry standards around a core platform that utilizes the latest production and research technology, the SAM 300 series has an ultrasound frequency range up to 500 MHz with transducers from 5 MHz – 400 MHz. Scanning range: x=250 µm-320 mm, y=250 µm-320 mm, z=100mm
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.