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Analysis microscope SAM 400 TWIN
for researchhigh-speedscanning acoustic

Analysis microscope - SAM 400 TWIN - PVA TePla Analytical Systems GmbH - for research / high-speed / scanning acoustic
Analysis microscope - SAM 400 TWIN - PVA TePla Analytical Systems GmbH - for research / high-speed / scanning acoustic
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Characteristics

Technical applications
for analysis, for research
Other characteristics
scanning acoustic, for semiconductors

Description

The SAM 400 TWIN is a high performance tool enabling non destructive acoustic investigations for high throughput analysis, quality control and research applications. It features a new high speed linear motion scanner and new rf and transducer technologies of up to 400 MHz, controlled through a user friendly graphical interface. A new master/slave concept enables arrays of two transducers to acquire simultaneous acoustic images. Built to semiconductor industry standards around a core platform that utilizes the latest production and research technology, the SAM TWIN SCAN can accurately handle wafers up to 400 mm. Ultrasound frequency range up to 500 MHz with transducer from 3 MHz - 400 MHz. Scanning range: x=250 µm-430 mm, y=250 µm-430 mm, z=100mm Auto focus is applied to each transducer
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.