Mass spectrometer ZSX Primus 400

XRFWDXRFautomatic

ZSX Primus 400 Rigaku's unique ZSX Primus 400 sequential wavelength dispersive X-ray fluorescence (WD-XRF) spectrometer was specifically designed to handle very large and/or heavy samples. Accepting samples up to 400 mm diameter, 50 mm thick and 30 kg mass, this system is ideal for analyzing sputtering targets, magnetic disks, or for multilayer film metrology or elemental analysis of large samples. XRF with customized sample adapter system Having the versatility to adapt to your specific sample types and analysis needs, this WDXRF spectrometer is adaptable to various sample sizes and shapes using optional (made to order) adapter inserts. With a variable measurement spot (30 mm to 0.5 mm diameter, with 5-step automatic selection) and mapping capability with multi-point measurements to check for sample uniformity, this uniquely flexible instrument can dramatically streamline your quality control processes. XRF with available camera and special lighting Optional real-time camera allows the analysis area to be viewed within software. The operator has complete certainty as to what is being measured.