X-ray diffractometer XtaLAB Synergy-ED

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FULLY INTEGRATED ELECTRON DIFFRACTOMETER A system any X-ray crystallographer will find intuitive to operate XtaLAB Synergy-ED is a new and fully integrated electron diffractometer, creating a seamless workflow from data collection to structure determination of three-dimensional molecular structures. The XtaLAB Synergy-ED is the result of an innovative collaboration to synergistically combine our core technologies: Rigaku’s high-speed, high-sensitivity photon-counting detector (HyPix-ED) and state-of-the-art instrument control and single crystal analysis software platform (CrysAlisPro for ED), and JEOL’s long-term expertise and market leadership in designing and producing transmission electron microscopes. The key feature of this product is that it provides researchers an integrated platform enabling easy access to electron crystallography. The XtaLAB Synergy-ED is a system any X-ray crystallographer will find intuitive to operate without having to become an expert in electron microscopy. The XtaLAB Synergy-ED was designed to address the increasing need to investigate smaller and smaller samples in structural research. With X-ray crystallography, the smallest possible crystal dimension is 1 micron, and only then when utilizing the brightest X-ray sources and noise free detectors. However, in recent years, there has been an increasing need for the structure analysis of substances that only form microcrystals, crystals that are only a few hundred nanometers or less in size. In recent years, a new analytical method, MicroED, has been developed that uses electron diffraction on a TEM electron microscope to measure 3D molecular structures from nanocrystalline materials.