Other test types testing machine RTA-SRT-8000
automaticwafer

other test types testing machine
other test types testing machine
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Characteristics

Test type
other test types
Operating mode
automatic
Test material
wafer

Description

Throughput: 7500@182 ; 7200@210 Breakage rate: 0.08%@182; 0.08%@210 Uptime: ≥99% Characteristics: Mode: Inline and offline Free grading solution Bificial AOI, IV/EL Single lane or dual lane All-in-one solution or standalone solution Common AB lanes solution Support MES interface and remote debug function Smart IGV interface Compatible wafers from M10, M12 and 220-230mm, half size Match multiple printing lines

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.