Scanning electron microscope electron beam source SEM 250 / SEM 500

SEM 250: Electron source for SEM and Auger experiments with spot size better than 250 nm at 12 kV beam voltage/1 nA beam current, at 16 mm working distance. Featuring 0.2 - 12 keV beam energy, Tungsten-filament, maximum beam current 1 A, the SEG 250 is a versatile, fully electrostatic focusing and deflection column, with variable beam current. Bakeable to 200 C. Mounting flange NW 63 CF (4" OD). SEM 500: Electron source for SEM and Auger experiments with spot size better than 500 nm at 12 kV beam voltage/1 nA beam current, at 15 mm working distance. Featuring 0.2 - 12 keV beam energy, Tungsten-filament, maximum beam current 1 A, the SEG 500 is a versatile, fully electrostatic focusing and deflection column, with variable beam current. Bakeable to 200 C. Mounting flange NW 63 CF (4" OD).