Scanning probe microscope (SPM) ultra-high-vacuum (UHV) system MULTIPROBE P,XP,XA,RM

The dedicated standard sample preparation variants P, XP and RM are tailored to fit the MULTIPROBE S system easily, even for a later upgrade. The MULTIPROBE LTS system can be upgraded with the XP or XA variant at any time. The powerful XA solution is a combination of an analysis and a preparation chamber. The MULTIPROBE P is a dual-chamber surface science UHV system with a large multi-technique analysis chamber for electron spectroscopy and UHV scanning probe microscopy, and a separate sample preparation chamber with FEL. The preparation chambers in the MULTIPROBE P offers standard sample preparation facilities like thin film growth or sample sputtering and heating. The MULTIPROBE XP is a dual-chamber surface science UHV system with a large multi-technique analysis chamber for electron spectroscopy and UHV scanning probe microscopy, and a separate sample preparation chamber with FEL. The preparation chamber in the MULTIPROBE XP offers extended sample preparation including sample sputtering, heating and thin film growth with in-situ characterisation by LEED or RHEED in the MULTIPROBE XP. The MULTIPROBE RM is a dual chamber surface science UHV system with a large multi-technique analysis chamber for electron spectroscopy and scanning probe microscopy, and a separate MBE chamber with LN2 cooling shroud ideally suited for research MBE and in-situ thin film growth characterisation with RHEED