Scanning probe microscope TESLA JT SPM
laboratoryin-situbenchtop

scanning probe microscope
scanning probe microscope
scanning probe microscope
scanning probe microscope
scanning probe microscope
scanning probe microscope
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Characteristics

Type
scanning probe
Technical applications
laboratory
Observation technique
in-situ
Configuration
benchtop
Other characteristics
ergonomic, UHV, low-temperature

Description

> 5 days uninterrupted measurement time in varying magnetic fields with only 11 L LHe Temperatures down to 1 K with 4He Ultra low thermal drift Magnetic fields BZ > 3 T Optical access STM and QPlus® AFM Ergonomic design & expandable to clusters The TESLA JT SPM is a Joule-Thompson cooled low temperature microscope working in ultra-high vacuum for advanced imaging and spectroscopy developed by Scienta Omicron and CryoVac. The cryostat contains a Joule-Thompson cooling stage mounted below the LHe bath cryostat with vapor-cooled shields and a surrounding LN2 vessel. Interruption-free experiments for more than four days are possible due to the exceptional low consumption rates of LHe and LN2. The TESLA JT SPM head features multiple measurement modes including STM, NC-AFM (QPlus®) and various spectroscopy modes including STS, IETS and force spec-troscopy. In-situ tip and sample exchange including four electrical contacts to the sample plate allow for an extended range of additional measurement modes. A split pair superconducting magnet, developed by CryoVac, provides magnetic fields up to BZ > 3T while allowing optical access to tip and sample and in-situ evaporation at low temperatures. The new TESLA JT SPM can be combined with UHV transfer to ARPES and MBE modules.

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