Test system for the electronics industry Compact Digital

The most recent innovations in digital components require a more sophisticated digital tester featuring capabilities that go beyond the simple logic analyzer. Industrial manufacturing requires processing capabilities at the hardware level to speed up test times. At the same time, the new logic families, based on featuring variable voltage levels and single or differential signals continue to make these even more complex. The tester designated as Compact Digital Test System (DTS) Next>series is Seica response to the constant demand for testing integrated devices via vector-based techniques and dedicated protocols such as Boundary Scan, without excluding the need to combine the in-circuit test as well. ATE Resources –ICT and functional testing Like any other Seica solution, the Compact DTS Next>series test system, uses the VIP platform, whose main feature is the possibility to deliver the best integration of technology and easiness of use, providing the user with all of the capabilities required for both in-circuit and functional testing without necessarily being an expert. This is possible thanks to the cutting-edge measurement system (based on ACL proprietary module) and to the VIVA management software. The first one, implemented on DSP technology, integrates all of the testing capabilities while enabling the fully-automated test execution. Moreover, the communication to the Main PC via optical fiber cable minimizes sensitiveness to external disturbances. The second one, designed with a simple and user-friendly logic, provides operational autonomy in terms of system management and testing routines executions.