Probe card

Vertical probe cards enable "multi-die measurement" and "full-wafer measurement," overcoming the limitations of cantilever-type probe cards. Perfect for WL-CSP and FlipChip applications, our probe cards support narrow-pitch, grid-arranged electrodes with ease .Our advanced technology handles special conditions, including high current, non-magnetic, high heat resistance and more. For tester connections, choose between direct mounting on a dedicated board or wiring to a universal board. At Seiken, every product is meticulously crafted to meet your unique requirements, ensuring reliable performance in a variety of environments. Our bespoke solutions are designed to deliver consistent and accurate results for all your testing needs. Have questions or need a custom solution? Contact us anytime—we’re here to help!