Ultrasonic flaw detector MIV-X
benchtop

Ultrasonic flaw detector - MIV-X - Shimadzu France - benchtop
Ultrasonic flaw detector - MIV-X - Shimadzu France - benchtop
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Characteristics

Technology
ultrasonic
Portability
benchtop

Description

Visualizing Cracks, Voids, Delamination, and Other Hidden Defects Normally Impossible to Check Visually Anyone Can Quickly and Easily Perform a Visual Surface Inspection Thanks to Shimadzu’s proprietary light imagining technique, which combines an ultrasonic oscillator with a stroboscope, defects near the surface of a material, including peeling of the bonding and adhesive surfaces of heterogeneous materials, as well as paint, thermal sprays, and coatings can be inspected easily and non-destructively. Simply attach the ultrasonic oscillator to the sample, and position the camera above the inspection surface. The propagation of the ultrasound is quickly displayed, and flaws are easily identified from the video. The easy-to-operate software is enhanced with functions to mark the flaws and measure the size easily. The lineup includes an optional optical zoom set, which can detect smaller flaws. With ultrasonic optical flaw detection technology, the sample is encouraged the displacement of the surface is detected optically, and the propagation of the ultrasonic wave on the surface is observed.The MIV-X Ultrasonic Optical Flaw Detector assists with regions where ultrasonic testing (UT) is difficult. Leave the non-destructive inspection of surfaces and near surfaces to MIV-X! The instrument is equipped with a function to digitally remove noise in the window showing the propagation of the ultrasound, simplifying flaw identification. The instrument is equipped with a user interface that simplifies operations, such as displaying a scale (ruler) on acquired images of cracks and peeling and measuring the distance between two selected points.

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