Simulation software Kronos

measurementcontrolmodeling

High performance, high-throughput cell library characterizer for standard cells, multi-bit cells, and I/O cells. Kronos Characterizer High-performance library characterization tool that generates accurate Liberty and Verilog/VHDL models for a wide variety of cells including: standard, multi-bit, and I/Os. The tool supports complex stimulus creation and measurement methods, as well as versatile control of output model syntax. Performance High throughput with fast runtime & multi-simulation job control Native integration with AFS & Eldo for high performance Highly scalable architecture, parallelizable up to 1000’s of CPUs Dynamic resource scheduling for on-the-fly modification of CPU resource pool size Disk I/O optimized for improved data storage utilization Variation Modeling and Re-Characterization Capabilities Fast & accurate LVF for timing, power, & constraints with full SPICE accuracy Supports LVF Moments for nonGaussian distributions Re-characterization flow adds new functions to existing libraries or creates new libraries Accounts for changes in process models, cell layouts, & SPICE models Characterization Outputs Liberty, Verilog, and VHDL/VITAL models NLDM and CCS timing, power & noise, and state-dependent models LVF and Moments IBIS model generation, and validation