Up to 5 GS/s digitizer-oscilloscope SDS6000L series
up to 10 GS/s8-channel4-channel

up to 5 GS/s digitizer-oscilloscope
up to 5 GS/s digitizer-oscilloscope
up to 5 GS/s digitizer-oscilloscope
up to 5 GS/s digitizer-oscilloscope
up to 5 GS/s digitizer-oscilloscope
up to 5 GS/s digitizer-oscilloscope
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Characteristics

Speed
up to 10 GS/s, up to 5 GS/s
Number of channels
4-channel, 8-channel
Options
analog, LAN, with arbitrary waveform generator

Description

SIGLENT’s SDS6000L series Low Profile Digital Storage Oscilloscopes provide up to 8 analog channels + 16 digital channels in a space-saving chassis size. This series is available in bandwidths of 2 GHz / 1 GHz / 500 MHz, feature a maximum sample rate of 5 GSa/s (10 GSa/s ESR) for each channel, and a maximum record length of 500 Mpts/ch. The SDS6000L series employs Siglent’s SPO technology with a maximum waveform capture rate of up to 170,000 wfm/ s (normal mode, up to 750,000 wfm/s in Sequence mode), 256-level intensity grading display function plus a color temperature display mode. It also employs an innovative digital trigger system with high sensitivity and low jitter. The trigger system supports multiple powerful triggering modes including serial bus triggering. Tools such as History waveform recording, Search and Navigate functions, Mask Test, Power Analysis and Eye/ Jitter Analysis allow for extended waveform records to be captured, stored, and analyzed. An impressive array of measurement and math capabilities, options for a 25 MHz arbitrary waveform generator, and serial decoding are also features of the SDS6000L. It can be used as a stand-alone oscilloscope by being connected to an external display and a mouse. It can also be remotely controlled over LAN thanks to the convenient built-in web server. Combined with a 64-channel synchronization distributor (SYN64), multiple SDS6000L modules can be organized as a high-speed acquisition system with up to 512 channels. A complete SCPI command set over the standard 1000M LAN connection provides very fast data acquisition to speed automated test applications.

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