Analysis software SigScopeLab
data analysisinterfacemeasurement

Analysis software - SigScopeLab - Siglent Technologies Co., Ltd - data analysis / interface / measurement
Analysis software - SigScopeLab - Siglent Technologies Co., Ltd - data analysis / interface / measurement
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Characteristics

Function
analysis, data analysis, interface, measurement, test, control, acquisition, signal processing
Applications
for digital signage
Operating system
Windows
Deployment mode
online

Description

•Multi-window display •Independent from oscilloscope functions •Waveform data offline analysis •Acquire waveform data to PC online for analysis SigScopeLab software, which is a professional time-domain signal analysis and oscilloscope control software running on the Windows operating system: it provides a similar user-interactive interface as SDS advanced oscilloscopes, which is perfect for avoiding the discomfort of being detached from the physical equipment; a variety of multi-window display modes can be selected, and the horizontal time base of each memory waveform can be adjusted individually, so that the details of multiple waveforms can be observed more clearly. It is not only capable of controlling the oscilloscope acquisition on-line and obtaining waveform data for analysis on PC, but also realize the offline analysis of the waveform data on the PC., effectively speeding up the analysis speed and improving test repeatability and reliability for engineers. Key Features •Offline waveform data analysis on PC – Maximum 2 channels for offline waveform data analysis. – Offline waveform data volume up to 2Mpts per channel. – Support waveform data with 12 bit vertical resolution. •Control remote SDS acquisition, and fetch waveform data to PC online for local analysis. •Familiar SDS platform enables measurement functions from the oscilloscope on the PC as post data analysis. Typical use cases include: – Dozens of automatic measurement functions. Support measurement statistics, Gating measurements, and Math measurements. Support histogram and trend chart statistics for measurement parameters. – 2 independent waveform operations.

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