Normal Probe
Mainly used for testing defects parallel to or slightly tilted against the test surface (e.g.steel plate)
Replaceable Membrane Normal Probe
Mainly used for inspecting container flaws as well as flaws parallel to the inspected surface, applicable for checking coarse and slightly-curved surfaced objects.
Replaceable Delay Line Normal Probe
Mainly used for inspecting flaws parallel to/ near to the inspected object surface, applicablefor inspected objects with sharp edge.
If the delay line is made ofhigh-temperature material, it can also inspect high-temperature objects.
Angle Probe (Transverse Wave)
Mainly used for testing defects perpendicular to or obviously tilted against the test surface (e.g.welding line testing).
Angle Probe ( Longitudinal Wave )
Mainly used fortesting defects perpendicular to or obviously tilted against the test surface (e.g.welding line testing).
Thickness Gauge Probe
Mainly used for measuring work piece thickness.
Dual-Element Angle Probe
Mainly used for testing defects tilted against the test surface or perpendicular to the test surface.
Dual-element Normal Probe
Mainly used for testing defects parallel to or slightly tilted against the test surface (e.g.steel plate);
Much more appropriate for detecting near surface flaws than normal probes.
Immersion Probe
Mainly used in situations where the work piece and the probe do not contact directly.
It is suitable for testing work piece with rough surface and automatic testing required to increase scanning speed and shorten testing time.
Variable-angle Probe
The reflection angle can be adjusted to meet different requirements.