Spring contact probe H-Pin®

Spring contact probe - H-Pin® - Smiths Interconnect
Spring contact probe - H-Pin® - Smiths Interconnect
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Description

The H-Pin is a stamped spring probe with the mechanical, electrical, and thermal performance of a spring probe, and the ease of use and high volume manufacturability of a stamped contact. The H-Pin serves applications without the typical compromises that are generally required when considering cost versus performance. Features & Benefits - Compliancy for large package warpage - Stable contact resistance and force - Solid beam electrical performance - Compliancy at high temperatures (180 °C) - Correlated bi, system evaluation and test - Reliable power and ground contact - Stocked inventory and better lead time - High volume capacity, quality control, and ease of use Feature Options - 0.40 mm to 0.70 mm travel - Flat-spring rate - BeCu H-Pin - Stainless steel core spring - Bandwidth –1dB @ 15 GHz - Current carrying capacity - High-volume stamping - Reel-to-reel pin insertion Overview Excellent mechanical and electrical performance. Utilizing high volume BeCu stamping technology, combined with a stainless steel spring for mechanical travel, the H-Pin has a working range up to 0.70 mm with a flat spring rate and can be utilized up to 15 GHz with –1.0 dB loss, carry up to 4 A of current and withstand temperatures up to 200 °C.

Exhibitions

Meet this supplier at the following exhibition(s):

SEMICON CHINA 2025

26-28 Mar 2025 Shanghai (China)

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    HANNOVER MESSE 2025
    HANNOVER MESSE 2025

    31 Mar - 04 Apr 2025 Hannover (Germany)

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    *Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.