Burn-in test socket Q-Series H-Pin®

Burn-in test socket - Q-Series H-Pin® - Smiths Interconnect
Burn-in test socket - Q-Series H-Pin® - Smiths Interconnect
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Characteristics

Options
burn-in

Description

The Q-Series socket is available for mid to large package sizes. The Q-Series is a fully molded socket body and lid designed to meet the rigors of a wide variety of accelerated life testing applications. The lid can be configured with or without a heatsink for precise thermal response and with the aid of design simulation air channels are optimized to maintain accurate temperature throughout testing. Features & Benefits - Industry-proven design, in-house tooling, molding, and machining, with 100% automated assembly. - Extensive catalog of components, configurable options - H-Pin offers unmatched DC performance. Feature options - Heat sink - HAST venting features Integrated thermal control with heater and sensor - Reverse seating plane - Max component clearance under the DUT - 2 or 3 plate systems - High temperature materials for above 200°C applications H Pin Technology This socket also uses the H-Pin contact technology providing wide RF performance capabilities and exceptional DC characteristics. The Q-Series socket checks all the boxes: high frequency, high current, high temperature, low inductance, and low loss. These features contribute to lower the cost of tests.

Exhibitions

Meet this supplier at the following exhibition(s):

SEMICON CHINA 2025

26-28 Mar 2025 Shanghai (China)

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    HANNOVER MESSE 2025
    HANNOVER MESSE 2025

    31 Mar - 04 Apr 2025 Hannover (Germany)

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    *Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.