Burn-in test socket R-Series H-Pin®

Burn-in test socket - R-Series H-Pin® - Smiths Interconnect
Burn-in test socket - R-Series H-Pin® - Smiths Interconnect
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Characteristics

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burn-in

Description

The R-Series product line is an open-top reliability socket used for accelerated life testing. With versions of the compression mount open-top design available as a drop-in replacement for other legacy products on the market, there is no need to purchase new burn-in boards. The open-top design allows for autoloading, and un-loading of the integrated circuit. The small socket footprint outline allows you to utilize the full resources available in the burn-In system for each burn-in board. Features & Benefits - Industry-proven design, In-house tooling, molding and machining with 100% automated assembly. - Extensive catalog of components, configurable options - H-Pin offers unmatched DC performance Feature Options - Auto IC loading / un-loading compatible - High temperature materials for above 200 °C applications - Drop-in replacement for legacy products Series Info RE - 5 mm to 9 mm package size range for QFN, LGA, and BGA R - 10 mm to 14 mm package size range for QFN and LGA - 10 mm to 13 mm package size range for BGA - Drop in replacement for legacy designs RL - 16 mm to 19 mm package size range for QFN, LGA, and BGA

Exhibitions

Meet this supplier at the following exhibition(s):

SEMICON CHINA 2025

26-28 Mar 2025 Shanghai (China)

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    HANNOVER MESSE 2025
    HANNOVER MESSE 2025

    31 Mar - 04 Apr 2025 Hannover (Germany)

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    *Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.