ICP-OES spectrometer GENESIS
optical emissionatomic absorptionCCD

ICP-OES spectrometer - GENESIS - SPECTRO Analytical Instruments - optical emission / atomic absorption / CCD
ICP-OES spectrometer - GENESIS - SPECTRO Analytical Instruments - optical emission / atomic absorption / CCD
ICP-OES spectrometer - GENESIS - SPECTRO Analytical Instruments - optical emission / atomic absorption / CCD - image - 2
ICP-OES spectrometer - GENESIS - SPECTRO Analytical Instruments - optical emission / atomic absorption / CCD - image - 3
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Characteristics

Type
optical emission, ICP-OES, atomic absorption, CCD
Domain
laboratory, industrial
Detector type
CCD
Wavelength

Max.: 770 nm

Min.: 175 nm

Description

The High-Performance, High-Value ICP-OES for Routine Elemental Analysis - Dual Side-On Interface with up to factor 2 improved sensitivity: no second measurement, reduced matrix effects, improved accuracy, high matrix tolerance - High measurement speed: Fast, simultaneous spectrum acquisition enabling short sample to sample time and the analysis of up to 700 samples per day - Low operating costs: minimal 0.5 l/min optic purge, no water chiller necessary Major updates have equipped SPECTRO GENESIS ICP-OES (also referred to as ICP-AES or ICP plasma) with a compact new design and some key state-of-the-art technologies. These reaffirm its status as the gold standard among entry-level elemental analyzers. The SPECTRO GENESIS ICP-OES is easy to use, delivers industrial-grade durability and throughput, and is surprisingly affordable to purchase and operate. Its linear dynamic range allows analysis from parts per billion (ppb) to percent levels. And its exciting new DSOI plasma optics furnish greatly increased sensitivity. So it can deliver fast, accurate analysis for an even wider range of emission control and process control applications.

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