The µLine-F1 is a compact laser interferometer for machine geometry inspection. It is designed for CNC device compensation and CMM device calibration. One of the advantages of inferometers is their extensive environmetal compensation.
The device can be applied on a selection of laboratory applications. It can be used in flatness, axes parallelism, vibration, straightness, squareness, small angle and dynamic measurements. The device is also used in rapid assessment of machine geometry, angular positioning, ball screw inspection and machine servicing.