X-ray diffractometer Xstress G2R

laboratoryportable

X-ray diffractometer Xstress G2R represents advances in design and construction, which provide enhanced reliability and function in a truly portable residual stress and retained austenite analyzer. Bi-axial and tri-axial stress state analysis is effortless and automated with rotating diffractometer. • Non-destructive • Suitable for laboratory, factory and ­field use • Rotating diffractometer enables bi-axial and tri-axial stress state analysis • Quick assembly, ready to use in 10 minutes • Easy replacement of X-ray tube (Cr, Cu, Co, Fe, V, Ti, Mn) which enables measuring different materials • Measurement distance 50 mm • Two NMOS position sensitive detectors • Instantly adjustable 2θ-angle • XTronic software for running the measurement and calculating residual stresses and retained austenite content (optional) • d-sin²χ and Ω-measurement modes as a standard Features • Two symmetrically positioned NMOS position sensitive detectors • standard detector width 15° • for other detectors see options • 2θ-range of the detectors • continuously adjustable within 110° to 165° • lower angles as option with special detector arcs • Standard measurement distance 50 mm • Replaceable collimators • 1/2/3/4/5 mm spot sizes special collimators available as an option