Laboratory test system S530

for semiconductorscompacthigh-voltage

BEAVERTON, Ore., Sept. 16, 2021 /PRNewswire/ -- Tektronix, Inc., a leading worldwide provider of test and measurement solutions, today released KTE V7.1 software for the Keithley S530 Series Parametric Test System to help accelerate semiconductor chip manufacturing just when the world market needs it most. New options made available for the first time with the KTE V7.1 release include a new parallel test capability and a unique high-voltage capacitance test option for emerging power and wide bandgap applications. KTE V7.1 improves test times more than 10 percent versus KTE V5.8, which means engineers can reduce downtime and make chips faster. The emergence of 5G and growth of IoT has fueled global demand for semiconductors. Global shortages not only call for increased manufacturing but faster ability to test new chips being developed. Tektronix's release of this new testing system can help speed up manufacturing by decreasing test time and thus accelerating delivery of new chips to market. "Today's emerging analog, wide bandgap (SiC and GaN), and power semiconductor technologies require parametric testing that maximizes measurement performance, addresses a wide product mix, and minimizes cost," says Peter Griffiths, general manager, Systems & Software at Tektronix. "Our customers, including the worlds' largest chip manufacturers, will enjoy the enhancements of KTE V7.1 that will enable engineers to continue to design innovations at unprecedented pace to meet demands of the changing markets."