The 2650 Series High Power SourceMeter SMU Instruments are designed specifically for characterizing and testing high voltage/current electronics and power semiconductors, such as diodes, FETs, and IGBTs, high brightness LEDs, DC-DC converters, batteries, solar cells, and other high power materials, components, modules, and subassemblies. They deliver unprecedented power, precision, speed, flexibility, and ease of use to improve productivity in R&D, production test, and reliability environments. Two instruments are available offering up to 3000V or up to 2000W of pulse current power.
Highly flexible, four-quadrant voltage and current source/load coupled with précision voltage and current meters
Source or sink (2651 A) up to 2.000W of pulsed power (±40V, ±50A) or up to 200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A); easily connect two units (in sériés or parallel) to create solutions up to ±100Aor ±80V
Source or sink (2657A) up to 180W of DC or pulsed power (±3000V@20mA, ±1500V@120mA)
Built-in web browser based software
Choice of digitizing or integrating measurement modes
TSP (Test Script Processing) technology
TSP-Link channel expansion bus
Compatible with Model 8010 High Pow'er Device Test Fixture and Model 8020 High Power Interface Panel
Free Test Script Builder software tool
Optional ACS Basic semiconductor component characterization software
Benefits
Offers best-in-class performance with 61/4-digit resolution.
Supports characterization/testing of power semiconductors, H BLEDs, optical devices, solar cells, and GaN, SiC, and other compound materials and devices.