Signal analyzer WavePulser 40iX series
for electrical networksfor testingfrequency response

Signal analyzer - WavePulser 40iX series - Teledyne LeCroy Europe - for electrical networks / for testing / frequency response
Signal analyzer - WavePulser 40iX series - Teledyne LeCroy Europe - for electrical networks / for testing / frequency response
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Characteristics

Measured entity
signal
Application domain
for electrical networks, for testing
Measured value
frequency response, impedance
Configuration
benchtop
Mode of use
automatic
Other characteristics
high-speed

Description

WavePulser 40iX is the ideal single measurement tool for high-speed hardware designers and test engineers. The combination of S-parameters (frequency domain) and Impedance Profiles (time domain) in a single acquisition with a deep toolbox provides unmatched characterization insight of high-speed interconnects. Key Features •S-parameters DC to 40 GHz, single-ended and mixed-mode •Impedance Profile with <1 mm resolution, differential and common-mode •Internal, automatic OSLT calibration •USB-connected, small, lightweight •Flexible display of the measurements •Remove effects from fixtures, connectors and cables •Emulate eye diagrams with CTLE, DFE and FFE equalization •Advanced jitter analysis S-Parameters Complete frequency characterization with a frequency range from DC to 40 GHz and supporting single-ended and mixed-mode S-parameters. Built-in automatic internal calibration is fast and easy. The OLST calibration kit supplied in the WavePulser-40iX-BUNDLE permits the measurement reference plane to be moved as required. Impedance Profile Precisely locate impairments with a spatial resolution of <1 mm and supporting both differential and common-mode impedance profiles. Both TDR and TDT capability are provided for complete coverage of both reflected and transmitted responses. Deep Toolbox WavePulser 40iX measurements are ready for simulation for with standard deep toolbox for simulation, de-embedding and time-gating. A built-in eye diagram display also permits equalized emulation. Advanced jitter analysis permits measurement of Total (Tj), Random (Rj) and Deterministic (Dj) jitter with de-convolution of Dj into component parts and a variety of jitter views.

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TDR and S-Parameters

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