SEM microscope MAGNAmetrologybenchtophigh-resolution
Add to favorites
Compare this product
Characteristics
- Type
- SEM
- Technical applications
- metrology
- Configuration
- benchtop
- Other characteristics
- high-resolution, high-contrast
Description
UHR SEM for nanomaterials characterization at sub-nanometer scale
• High-resolution and high-contrast imaging of nextgen materials (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures)
• Excellent platform suitable for SEM/STEM metrology at sub-nanometer scale
• Fast setup of the electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™
• Multi-detector system TriBE™ and TriSE™ for sample nanocharacterization
• Intuitive software modular platform designed for effortless operation regardless users’ skill level
Catalogs
No catalogs are available for this product.
See all of Tescan GmbH‘s catalogs
Related Searches
- Microscope
- Laboratory microscope
- Inspection microscope
- Tabletop microscope
- Measuring microscope
- Analysis microscope
- High-resolution microscope
- Industrial microscope
- Automatic microscope
- Materials research microscope
- Quality control microscope
- Research microscope
- Modular microscope
- Confocal microscope
- High-precision microscope
- Real-time microscope
- SEM microscope
- High-contrast microscope
- Secondary electron microscope
- Materials inspection microscope
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.