FIB/SEM microscope AMBER Xfor analysisin-lens SEmodular
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Characteristics
- Type
- FIB/SEM
- Technical applications
- for analysis
- Detector type
- in-lens SE
- Other characteristics
- modular, ultra-high resolution
Description
A unique combination of Plasma FIB and field-free UHR FE-SEM for multiscale materials characterization
• High throughput, large area FIB processing up to 1 mm
• Ga-free microsample preparation
• Ultra-high resolution, field-free FEG-SEM imaging and analysis
• In-lens SE and BSE detection
• Resolution optimization for high-throughput, multi-modal FIB-SEM tomography
• Superior field of view for easy navigation
• Essence™ easy-to-use, modular graphical user interface
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