FIB/SEM microscope AMBER cryolaboratory
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Characteristics
- Type
- FIB/SEM
- Technical applications
- laboratory
Description
An alternative solution to prepare cryo lamellae for your TEM
• Flexible cryo-FIB-SEM workstation for your most demanding applications under cryogenic conditions
• Optimized cryo-TEM lamella workflow for artefact-free planar on-grid lamella from plunge frozen specimens
• Compatible solution with all cryo-TEM on the market
• Excellent SEM imaging performance at very low-kV
• Cryo-user account with defined DrawBeam™ project dedicated for your cryo operations
• Easy navigation including extended field-of-view, two cameras, and 3D active collision model
• Easy-to-use, fully customizable, application-oriented and modular user interface
• Attractive optional packages for various applications
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.