Scanning electron microscope Prisma E SEM

for researchindustrialsecondary electron

Scanning electron microscope for industrial research and development with environmental scanning electron microscope capability. Environmental scanning electron microscope The Thermo Scientific Prisma E Scanning Electron Microscope (SEM) combines a wide array of imaging and analytical modalities with advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial research and development, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. The Prisma E SEM succeeds the highly successful Thermo Scientific Quanta SEM. ESEM with EDS The unique combination of accessible all-round performance, a large set of accessories, and the most intuitive elemental analysis with Thermo Scientific ColorSEM make the Prisma E SEM the go-to SEM for micro-scale imaging and analysis in any industry or field. Prisma E Scanning Electron Microscope features Elemental information at your fingertips Live composition-based image coloring for intuitive elemental analysis with optional ChemiSEM Technology and integrated energy-dispersive X-ray spectroscopy (EDS). Speed up your work and obtain the most complete sample information with always-on analysis. Excellent image quality Excellent image quality at low kV and low vacuum thanks to flexible vacuum modes, including through-the-lens differential pumping. Simultaneous secondary electron (SE) and backscattered electron (BSE) imaging in every mode of operation. Minimize sample preparation time Low vacuum and ESEM capability enable charge-free imaging and analysis of nonconductive and/or hydrated specimens.