Battery microscope Phenom ParticleX
SEMfor analysisfor quality control

battery microscope
battery microscope
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Characteristics

Type
SEM
Technical applications
for analysis, for quality control, for materials analysis, for battery
Configuration
desktop, small
Detector type
secondary electron, back-scattered electron
Other characteristics
high-resolution, automated
Magnification

Max.: 200,000 unit

Min.: 160 unit

Resolution

Max.: 10 nm

Min.: 0 nm

Description

Desktop scanning electron microscope for battery production and research. Advanced battery materials analysis Phenom Desktop SEM designed for battery materials analysis In battery production and research, the quality of materials is becoming critical. Small contaminants in the NCM powder, for example, can have disastrous results in the final product. To trace these contaminants effectively, high-resolution SEM imaging with EDS analysis for chemistry is needed. When fully automated, this combination is a powerful tool for powder quality inspection. Phenom ParticleX Battery Desktop SEM key features Conductance classifications Each particle class can be labeled with a conductance of the particles, allowing you to sort on conductance of particles. This allows you to assess the impact of contamination much more accurately since a small organic contamination is not as severe as a metallic conductive contamination. Ternary diagram To view overall chemistry of the particle population, a ternary diagram can be generated where all particles are represented. With Ni, Co, and Mn on each axis, the outyears and general trends can be seen instantly.
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.